call waitsw
- jp main
+ jr main
signon:
db $0D,$0A,$1B,"[1mFPGABoy Diagnostic ROM",$1B,"[0m",$0D,$0A,0
ld [hli],a
ld a, $DF
cp h
- jp nz, .wr
+ jr nz, .wr
ld a, $80
cp l
- jp nz, .wr
+ jr nz, .wr
ld hl, $C000 ; Read loop
.rd:
ld b,a
ld a, [hli]
cp b
- jp nz, .memfail
+ jr nz, .memfail
ld a, $DF
cp h
- jp nz, .rd
+ jr nz, .rd
ld a, $80
cp l
- jp nz, .rd
+ jr nz, .rd
ld hl, testokstr ; Say we're OK
call puts
ld hl,waitswstr
call puts
+ ld c, $07
+ ld a, $07 ;start timer, 4.096KHz
+ ld [c], a
+
ld c, $51
ld a, $00
ld [c],a
+.loop1:
+ push bc
+ call testa
+ pop bc
ld c, $51
ld b, $0
-.loop1:
ld a,[c]
cp b
- jp z,.loop1
+ jr z,.loop1
.loop2:
ld a,[c]
cp b
- jp nz,.loop2
+ jr nz,.loop2
ret
waitswstr:
- db "Diagnostic ROM complete; flip switches to nonzero and then to zero to reset.",$0D,$0A,0
+ db "Diagnostic ROM complete; flip switches to nonzero and then to zero to reset. Expect A.",$0D,$0A,0
+
+testa:
+ ld c, $0F
+ ld a, [c]
+ ld b, $00
+ cp b
+ ret z
+ xor a
+ ld [c], a
+ ld hl, $D000
+ ld c, [hl]
+ inc bc
+ ld [hl], c
+ ld a, c
+ ld c, $50
+ ld [c], a
+ ret
; Core instruction basic acceptance tests.
insntest:
ld hl, .pushpopfail
ld a, d
cp b
- jp nz,.fail
+ jr nz,.fail
ld a, e
cp c
- jp nz,.fail
+ jr nz,.fail
; Test ALU (HL).
ld hl, .ff
ld a, $FF
xor [hl]
ld hl, .xorhlfail
- jp nz, .fail
+ jr nz, .fail
+
+ ; Test JP (HL)
+ ld hl, .jphl
+ jp [hl]
+ ld hl, .jphlfail
+ jr .fail
+ rst $00
+.jphl:
+
+ ; Test JR
+ ld a, $FF
+ ld b, $00
+ cp b
+ jr nz,.jr
+ ld hl, .jrfail
+ jr .fail
+ rst $00
+.jr:
+
+ ; Test inc16
+ ld d, $12
+ ld e, $FF
+ ld hl, .inc16fail
+ inc de
+ ld a, $13
+ cp d
+ jr nz, .fail
+ ld a, $00
+ cp e
+ jr nz, .fail
; Test CP.
ld hl, .cpfail
ld a, $10
ld b, $20
cp b
- jp nc,.fail
+ jr nc,.fail
ld a, $20
ld b, $10
cp b
- jp c,.fail
+ jr c,.fail
; Test CPL
ld hl, .cplfail
ld b, $AA
cpl
cp b
- jp nz,.fail
+ jr nz,.fail
ld hl, .ok
call puts
ret
.fail:
+ call puts
+ ld hl, .testfailed
call puts
ret
.insnteststr:
- db "Testing instructions... ",$0
+ db "Testing instructions... ",0
.pushpopfail:
- db "PUSH/POP test failed.",$0D,$0A,0
+ db "PUSH/POP",0
.ff:
db $FF
.xorhlfail:
- db "XOR [HL] test failed.",$0D,$0A,0
+ db "XOR [HL]",0
+.jphlfail:
+ db "JP [HL]",0
+.jrfail:
+ db "JR",0
.cpfail:
- db "CP test failed.",$0D,$0A,0
+ db "CP",0
.cplfail:
- db "CPL test failed.",$0D,$0A,0
+ db "CPL",0
+.inc16fail:
+ db "INC16",0
+.testfailed:
+ db " test failed.",$0D,$0A,0
.ok:
db "OK!",$0D,$0A,0
; Serial port manipulation functions.
putc:
- push af
ld b, 0
ld c, $50
.waitport:
ld a,[c]
cp b
- jp nz,.waitport
- pop af
+ jr nz,.waitport
ld [c],a
ret
ld a, [hli]
ld b, $00
cp b
- jp z, .done
+ ret z
call putc
- jp puts
-.done:
- ret
-
+ jr puts