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1 section "end",HOME[1024]
2 nop
3
4 SECTION "a",HOME[$00]
5
6start: jp main
7
8 section "vbl",HOME[$40]
9 jp vbl
10
11 section "lcdc",HOME[$48]
12 jp lcdc
13
14 section "tmro",HOME[$50]
15 jp tmro
16
17main:
18 ld a, $FF
19 ld c, $51
20 ld [c], a
21
22 ld sp, $DFF0
23
24 ld a, $04 ;start timer, 4.096KHz
25 ld c, $07
26 ld [c], a
27
28 ld hl, $DF81
29 xor a
30 ld [hli], a
31 ld [hli], a
32
33 ld hl, signon
34 call puts
35
36 ei
37
38 call memtest
39
40 call insntest
41
42 call waitsw
43
44 di
45
46 jr main
47
48signon:
49 db $0D,$0A,$1B,"[1mFPGABoy Diagnostic ROM",$1B,"[0m",$0D,$0A,0
50
51vbl:
52lcdc:
53 PUSH AF
54 PUSH BC
55
56 xor a
57 ld c, $0F
58 ld [c], a
59
60 POP BC
61 POP AF
62
63 reti
64
65tmro:
66 PUSH AF
67 PUSH BC
68 PUSH DE
69 PUSH HL
70
71 xor a
72 ld c, $0F
73 ld [c], a
74
75 ld hl, $DF82
76 ld a, [hld]
77 cp 0
78 jr z, .noprint
79 ld a, $41 ; print A
80 call putc
81.noprint:
82 inc [hl]
83 ld a, [hl]
84 ld c, $51
85 ld [c], a
86
87 POP HL
88 POP DE
89 POP BC
90 POP AF
91 RETI
92
93; Memory tester: writes h ^ l to all addresses from C000 to DF80.
94memtest:
95 ld hl,memteststr
96 call puts
97
98 ld hl, $C001 ; Write loop
99.wr:
100 ld a,h
101 xor l
102 ld [hli],a
103 ld a, h
104 cp $DF
105 jr nz, .wr
106 ld a, l
107 cp $80
108 jr nz, .wr
109
110 ld hl, $C001 ; Read loop
111.rd:
112 ld a,h
113 xor l
114 ld b,a
115 ld a, [hli]
116 cp b
117 jr nz, .memfail
118
119 ld a, h
120 cp $DF
121 jr nz, .rd
122 ld a, l
123 cp $80
124 jr nz, .rd
125
126 ld hl, testokstr ; Say we're OK
127 call puts
128 ret
129.memfail: ; Say we failed (sadface)
130 ; decrement hl the easy way
131 ld a,[hld]
132 push hl
133 ld hl, failatstr
134 call puts
135 pop hl
136 ld a, h
137 call puthex
138 ld a, l
139 call puthex
140 ld a, $0A
141 call putc
142 ld a, $0D
143 call putc
144 ret
145memteststr:
146 db "Testing memory from $C000 to $DF80...",0
147testokstr:
148 db " OK!",$0D,$0A,0
149failatstr:
150 db " Test failed at $",0
151
152puthex: ; Put two hex nibbles to the serial console.
153 push af
154 rra
155 rra
156 rra
157 rra
158 and $0F
159 add $30
160 call putc
161 pop af
162 and $0F
163 add $30
164 call putc
165 ret
166
167; Wait for switches to be flipped on and off again.
168waitsw:
169 ld hl,waitswstr
170 call puts
171
172 ld hl,$DF82
173 ld a, 1
174 ld [hl], a
175
176 ld c, $51
177 xor a
178 ld [c],a
179
180.loop1:
181 ld a,[c]
182 cp $0
183 jr z,.loop1
184.loop2:
185 ld a,[c]
186 cp $0
187 jr nz,.loop2
188 ret
189
190waitswstr:
191 db "Diagnostic ROM complete; flip switches to nonzero and then to zero to reset. Expect A.",$0D,$0A,0
192
193; Core instruction basic acceptance tests.
194insntest:
195 ld hl, .insnteststr
196 call puts
197
198 ; Test PUSH and POP.
199 ld b, $12
200 ld c, $34
201 ld d, $56
202 ld e, $78
203 push bc
204 pop de
205 ld hl, .pushpopfail
206 ld a, d
207 cp b
208 jr nz,.fail
209 ld a, e
210 cp c
211 jr nz,.fail
212
213 ; Test ALU (HL).
214 ld hl, .ff
215 ld a, $FF
216 xor [hl]
217 ld hl, .xorhlfail
218 jr nz, .fail
219
220 ; Test JP (HL)
221 ld hl, .jphl
222 jp [hl]
223 ld hl, .jphlfail
224 jr .fail
225 rst $00
226.jphl:
227
228 ; Test JR
229 ld a, $FF
230 cp $0
231 jr nz,.jr
232 ld hl, .jrfail
233 jr .fail
234 rst $00
235.jr:
236
237 ; Test inc16
238 ld d, $12
239 ld e, $FF
240 ld hl, .inc16fail
241 inc de
242 ld a, $13
243 cp d
244 jr nz, .fail
245 ld a, $00
246 cp e
247 jr nz, .fail
248
249 ; Test CP.
250 ld hl, .cpfail
251 ld a, $10
252 cp $20
253 jr nc,.fail
254 ld a, $20
255 cp $10
256 jr c,.fail
257
258 ; Test CPL
259 ld hl, .cplfail
260 ld a, $55
261 cpl
262 cp $AA
263 jr nz,.fail
264
265 ; Test DI/EI delay
266 di
267 ld hl, .dinocausefail
268 ld c, $0F ; First, wait until an interrupt happens...
269.wait: ld a, [c]
270 and $04
271 cp 0
272 jr z, .wait
273 ei ; Now make sure that an IRQ didn't happen on EI/DI
274 di
275 ld a, [c]
276 and $04
277 cp 0
278 jr z, .fail
279 ld hl, .dicausefail
280 ei ; Make sure that an IRQ does happen on EI/NOP/DI
281 nop
282 nop
283 di
284 ld a, [c]
285 and $04
286 cp 0
287 jr nz, .fail
288 ei
289
290 ld hl, .ok
291 call puts
292 ret
293.fail:
294 ei
295 call puts
296 ld hl, .testfailed
297 call puts
298 ret
299.insnteststr:
300 db "Testing instructions... ",0
301.pushpopfail:
302 db "PUSH/POP",0
303.ff:
304 db $FF
305.xorhlfail:
306 db "XOR [HL]",0
307.jphlfail:
308 db "JP [HL]",0
309.jrfail:
310 db "JR",0
311.cpfail:
312 db "CP",0
313.cplfail:
314 db "CPL",0
315.inc16fail:
316 db "INC16",0
317.dinocausefail:
318 db "DI/EI does not cause interrupt",0
319.dicausefail:
320 db "DI/NOP/EI cause interrupt",0
321.testfailed:
322 db " test failed.",$0D,$0A,0
323.ok:
324 db "OK!",$0D,$0A,0
325
326; Serial port manipulation functions.
327putc:
328 ld c, $50
329 push af
330.waitport:
331 ld a,[c]
332 cp $00
333 jr nz,.waitport
334 pop af
335 ld [c],a
336 ret
337
338puts:
339 ld a, [hli]
340 cp $00
341 ret z
342 call putc
343 jr puts
344
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